Development of C60 plasma ion source for time-of-flight secondary ion mass spectrometry applications

Qing Ji; Ye Chen; Lili Ji; Sami Hahto; Ka Ngo Leung; Tae Geol Lee; Dae Won Moon

doi:10.1063/1.2804912

Development of C₆₀ plasma ion source for time-of-flight secondary ion mass spectrometry applications

Qing Ji
, Ye Chen
, Lili Ji
, Sami Hahto
, Ka Ngo Leung
, Tae Geol Lee
, Dae Won Moon

Department of New Biology

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Initial data from a multicusp ion source developed for buckminsterfullerene (C60) cluster ion production are reported in this article. A C60+ beam current of 425 nA and a C60- beam current of 200 nA are obtainable in continuous mode. Compared to prior work using electron impact ionization, the multicusp ion source provides at least two orders of magnitude increase in the extractable C60+ beam current. Mass spectra for both positive and negative bismuth cluster ions generated by the multicusp ion source are also included.

Original language	English
Article number	02B309
Journal	Review of Scientific Instruments
Volume	79
Issue number	2
DOIs	https://doi.org/10.1063/1.2804912
State	Published - 2008

Bibliographical note

Funding Information:
This work is supported by the Nano-Bio Science and Technology of MOST. Support from members of Plasma and Ion Source Technology at Lawrence Berkeley National Laboratory in U.S.A. is gratefully acknowledged.

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10.1063/1.2804912

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title = "Development of C60 plasma ion source for time-of-flight secondary ion mass spectrometry applications",

abstract = "Initial data from a multicusp ion source developed for buckminsterfullerene (C60) cluster ion production are reported in this article. A C60+ beam current of 425 nA and a C60- beam current of 200 nA are obtainable in continuous mode. Compared to prior work using electron impact ionization, the multicusp ion source provides at least two orders of magnitude increase in the extractable C60+ beam current. Mass spectra for both positive and negative bismuth cluster ions generated by the multicusp ion source are also included.",

author = "Qing Ji and Ye Chen and Lili Ji and Sami Hahto and Leung, \{Ka Ngo\} and Lee, \{Tae Geol\} and Moon, \{Dae Won\}",

note = "Funding Information: This work is supported by the Nano-Bio Science and Technology of MOST. Support from members of Plasma and Ion Source Technology at Lawrence Berkeley National Laboratory in U.S.A. is gratefully acknowledged.",

year = "2008",

doi = "10.1063/1.2804912",

language = "English",

volume = "79",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

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T1 - Development of C60 plasma ion source for time-of-flight secondary ion mass spectrometry applications

AU - Ji, Qing

AU - Chen, Ye

AU - Ji, Lili

AU - Hahto, Sami

AU - Leung, Ka Ngo

AU - Lee, Tae Geol

AU - Moon, Dae Won

N1 - Funding Information: This work is supported by the Nano-Bio Science and Technology of MOST. Support from members of Plasma and Ion Source Technology at Lawrence Berkeley National Laboratory in U.S.A. is gratefully acknowledged.

PY - 2008

Y1 - 2008

N2 - Initial data from a multicusp ion source developed for buckminsterfullerene (C60) cluster ion production are reported in this article. A C60+ beam current of 425 nA and a C60- beam current of 200 nA are obtainable in continuous mode. Compared to prior work using electron impact ionization, the multicusp ion source provides at least two orders of magnitude increase in the extractable C60+ beam current. Mass spectra for both positive and negative bismuth cluster ions generated by the multicusp ion source are also included.

AB - Initial data from a multicusp ion source developed for buckminsterfullerene (C60) cluster ion production are reported in this article. A C60+ beam current of 425 nA and a C60- beam current of 200 nA are obtainable in continuous mode. Compared to prior work using electron impact ionization, the multicusp ion source provides at least two orders of magnitude increase in the extractable C60+ beam current. Mass spectra for both positive and negative bismuth cluster ions generated by the multicusp ion source are also included.

UR - https://www.scopus.com/pages/publications/40149093868

U2 - 10.1063/1.2804912

DO - 10.1063/1.2804912

M3 - Article

C2 - 18315175

AN - SCOPUS:40149093868

SN - 0034-6748

VL - 79

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 2

M1 - 02B309

ER -

Development of C₆₀ plasma ion source for time-of-flight secondary ion mass spectrometry applications

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