Determination of rotatable anisotropy in exchange-biased bilayers using anisotropic magnetoresistance technique

J. K. Kim; S. W. Kim; K. A. Lee; B. K. Kim; J. H. Kim; S. S. Lee; D. G. Hwang; C. G. Kim; C. O. Kim

doi:10.1063/1.1558191

Determination of rotatable anisotropy in exchange-biased bilayers using anisotropic magnetoresistance technique

J. K. Kim, S. W. Kim, K. A. Lee, B. K. Kim, J. H. Kim, S. S. Lee, D. G. Hwang, C. G. Kim, C. O. Kim

Department of Physics and Chemistry

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

The determination of rotatable anisotropy in exchange-biased bilayers using anisotropic magnetoresistance (AMR) was discussed. A four-point terminal method was used to characterize the magnetic properties form the AMR magnetoresistance curves. Results proved that weak exchange coupling regions increased as the antiferromagnet thickness decreased.

Original language	English
Pages (from-to)	7714-7716
Number of pages	3
Journal	Journal of Applied Physics
Volume	93
Issue number	10 3
DOIs	https://doi.org/10.1063/1.1558191
State	Published - 15 May 2003

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title = "Determination of rotatable anisotropy in exchange-biased bilayers using anisotropic magnetoresistance technique",

abstract = "The determination of rotatable anisotropy in exchange-biased bilayers using anisotropic magnetoresistance (AMR) was discussed. A four-point terminal method was used to characterize the magnetic properties form the AMR magnetoresistance curves. Results proved that weak exchange coupling regions increased as the antiferromagnet thickness decreased.",

author = "Kim, \{J. K.\} and Kim, \{S. W.\} and Lee, \{K. A.\} and Kim, \{B. K.\} and Kim, \{J. H.\} and Lee, \{S. S.\} and Hwang, \{D. G.\} and Kim, \{C. G.\} and Kim, \{C. O.\}",

year = "2003",

month = may,

day = "15",

doi = "10.1063/1.1558191",

language = "English",

volume = "93",

pages = "7714--7716",

journal = "Journal of Applied Physics",

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publisher = "American Institute of Physics",

number = "10 3",

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TY - JOUR

T1 - Determination of rotatable anisotropy in exchange-biased bilayers using anisotropic magnetoresistance technique

AU - Kim, J. K.

AU - Kim, S. W.

AU - Lee, K. A.

AU - Kim, B. K.

AU - Kim, J. H.

AU - Lee, S. S.

AU - Hwang, D. G.

AU - Kim, C. G.

AU - Kim, C. O.

PY - 2003/5/15

Y1 - 2003/5/15

N2 - The determination of rotatable anisotropy in exchange-biased bilayers using anisotropic magnetoresistance (AMR) was discussed. A four-point terminal method was used to characterize the magnetic properties form the AMR magnetoresistance curves. Results proved that weak exchange coupling regions increased as the antiferromagnet thickness decreased.

AB - The determination of rotatable anisotropy in exchange-biased bilayers using anisotropic magnetoresistance (AMR) was discussed. A four-point terminal method was used to characterize the magnetic properties form the AMR magnetoresistance curves. Results proved that weak exchange coupling regions increased as the antiferromagnet thickness decreased.

UR - https://www.scopus.com/pages/publications/0037642479

U2 - 10.1063/1.1558191

DO - 10.1063/1.1558191

M3 - Article

AN - SCOPUS:0037642479

SN - 0021-8979

VL - 93

SP - 7714

EP - 7716

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10 3

ER -

Determination of rotatable anisotropy in exchange-biased bilayers using anisotropic magnetoresistance technique

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