Depth profile of transverse permeability spectrum in an annealed Co-based amorphous ribbon

Y. W. Rheem; L. Jin; S. S. Yoon; C. G. Kim; C. O. Kim; E. E. Shalyguina

doi:10.1109/INTMAG.2003.1230321

Depth profile of transverse permeability spectrum in an annealed Co-based amorphous ribbon

Y. W. Rheem
, L. Jin
, S. S. Yoon
, C. G. Kim
, C. O. Kim
, E. E. Shalyguina

Department of Physics and Chemistry

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this article, we investigate the depth profile of transverse permeability spectra extracted from MI spectra in annealed ribbons under weak magnetic field in order to clarify the effect of crystalline layer on the magnetisation process.

Original language	English
Title of host publication	Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	0780376471, 9780780376472
DOIs	https://doi.org/10.1109/INTMAG.2003.1230321
State	Published - 2003
Event	2003 IEEE International Magnetics Conference, Intermag 2003 - Boston, United States Duration: 30 Mar 2003 → 3 Apr 2003

Publication series

Name	Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference

Conference

Conference	2003 IEEE International Magnetics Conference, Intermag 2003
Country/Territory	United States
City	Boston
Period	30/03/03 → 3/04/03

Bibliographical note

Publisher Copyright:
© 2003 IEEE.

Keywords

Amorphous magnetic materials
Amorphous materials
Annealing
Crystalline materials
Crystallization
Etching
Magnetic field measurement
Oxidation
Permeability
Temperature

Access to Document

10.1109/INTMAG.2003.1230321

Cite this

Rheem, Y. W., Jin, L., Yoon, S. S., Kim, C. G., Kim, C. O., & Shalyguina, E. E. (2003). Depth profile of transverse permeability spectrum in an annealed Co-based amorphous ribbon. In Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference Article 1230321 (Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2003.1230321

@inproceedings{0f81ec3ea94f430f8dcd254772a3e39c,

title = "Depth profile of transverse permeability spectrum in an annealed Co-based amorphous ribbon",

abstract = "In this article, we investigate the depth profile of transverse permeability spectra extracted from MI spectra in annealed ribbons under weak magnetic field in order to clarify the effect of crystalline layer on the magnetisation process.",

keywords = "Amorphous magnetic materials, Amorphous materials, Annealing, Crystalline materials, Crystallization, Etching, Magnetic field measurement, Oxidation, Permeability, Temperature",

author = "Rheem, \{Y. W.\} and L. Jin and Yoon, \{S. S.\} and Kim, \{C. G.\} and Kim, \{C. O.\} and Shalyguina, \{E. E.\}",

note = "Publisher Copyright: {\textcopyright} 2003 IEEE.; 2003 IEEE International Magnetics Conference, Intermag 2003 ; Conference date: 30-03-2003 Through 03-04-2003",

year = "2003",

doi = "10.1109/INTMAG.2003.1230321",

language = "English",

series = "Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference",

}

Rheem, YW, Jin, L, Yoon, SS, Kim, CG, Kim, CO & Shalyguina, EE 2003, Depth profile of transverse permeability spectrum in an annealed Co-based amorphous ribbon. in Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference., 1230321, Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference, Institute of Electrical and Electronics Engineers Inc., 2003 IEEE International Magnetics Conference, Intermag 2003, Boston, United States, 30/03/03. https://doi.org/10.1109/INTMAG.2003.1230321

Depth profile of transverse permeability spectrum in an annealed Co-based amorphous ribbon. / Rheem, Y. W.; Jin, L.; Yoon, S. S. et al.
Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference. Institute of Electrical and Electronics Engineers Inc., 2003. 1230321 (Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Depth profile of transverse permeability spectrum in an annealed Co-based amorphous ribbon

AU - Rheem, Y. W.

AU - Jin, L.

AU - Yoon, S. S.

AU - Kim, C. G.

AU - Kim, C. O.

AU - Shalyguina, E. E.

PY - 2003

Y1 - 2003

N2 - In this article, we investigate the depth profile of transverse permeability spectra extracted from MI spectra in annealed ribbons under weak magnetic field in order to clarify the effect of crystalline layer on the magnetisation process.

AB - In this article, we investigate the depth profile of transverse permeability spectra extracted from MI spectra in annealed ribbons under weak magnetic field in order to clarify the effect of crystalline layer on the magnetisation process.

KW - Amorphous magnetic materials

KW - Amorphous materials

KW - Annealing

KW - Crystalline materials

KW - Crystallization

KW - Etching

KW - Magnetic field measurement

KW - Oxidation

KW - Permeability

KW - Temperature

UR - https://www.scopus.com/pages/publications/84949524485

U2 - 10.1109/INTMAG.2003.1230321

DO - 10.1109/INTMAG.2003.1230321

M3 - Conference contribution

AN - SCOPUS:84949524485

T3 - Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference

BT - Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2003 IEEE International Magnetics Conference, Intermag 2003

Y2 - 30 March 2003 through 3 April 2003

ER -

Rheem YW, Jin L, Yoon SS, Kim CG, Kim CO, Shalyguina EE. Depth profile of transverse permeability spectrum in an annealed Co-based amorphous ribbon. In Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference. Institute of Electrical and Electronics Engineers Inc. 2003. 1230321. (Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference). doi: 10.1109/INTMAG.2003.1230321

Depth profile of transverse permeability spectrum in an annealed Co-based amorphous ribbon

Abstract

Publication series

Conference

Bibliographical note

Keywords

Access to Document

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