Defect structure in thin films of a lamellar block copolymer self-assembled on neutral homogeneous and chemically nanopatterned surfaces
- Sang Ouk Kim
- , Bong Hoon Kim
- , Kwanghyon Kim
- , Chong Min Koo
- , Mark P. Stoykovich
- , Paul F. Nealey
- , Harun H. Solak
- Korea Advanced Institute of Science and Technology
- LG Corporation
- University of Wisconsin-Madison
- Paul Scherrer Institute
Research output: Contribution to journal › Article › peer-review
69
Scopus
citations