DAC: Dedup-assisted compression scheme for improving lifetime of NAND storage systems

Jisung Park, Sungjin Lee, Jihong Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

11 Scopus citations

Abstract

Thanks to an aggressive scaling of semiconductor devices, the capacity of NAND flash-based solid-state-drives (SSDs) has increased greatly. However, this benefit comes at the expense of a serious degradation of NAND device's lifetime. In order to improve the lifetime of flash-based SSDs, various data reduction techniques, such as deduplication, lossless compression, and delta compression, are rapidly adopted to SSDs. Although each technique has been extensively studied, efficiently combining these techniques in a synergistic fashion was not thoroughly investigated. In this paper, we propose a novel dedup-assisted compression (DAC) scheme that integrates existing data reduction techniques so that potential benefits of individual ones can be maximized while overcoming their inherent limitations. By doing so, DAC greatly reduces the amount of write traffic sent to SSDs. DAC also requires negligible resources by utilizing existing hardware modules. Our evaluation results show that the proposed DAC decreases the amount of written data by up to 30% over a simple integration of deduplication and lossless compression.

Original languageEnglish
Title of host publicationProceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1249-1252
Number of pages4
ISBN (Electronic)9783981537093
DOIs
StatePublished - 11 May 2017
Event20th Design, Automation and Test in Europe, DATE 2017 - Swisstech, Lausanne, Switzerland
Duration: 27 Mar 201731 Mar 2017

Publication series

NameProceedings of the 2017 Design, Automation and Test in Europe, DATE 2017

Conference

Conference20th Design, Automation and Test in Europe, DATE 2017
Country/TerritorySwitzerland
CitySwisstech, Lausanne
Period27/03/1731/03/17

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

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