Abstract
Angular dependence of Hex and Hc, and the critical angle behavior are measured in CoFe/MnIr bilayers annealed at 200°C and 340°C. The interfacial exchange coupling anisotropy and the antiferromagnet anisotropy at tAF < tAFc are estimated from the best fitting of angular dependence of Hex and Hc using Stoner-Wohlfarth (S-W) model. These results confirm existence of interfacial exchange coupling anisotropy between F and AF layers for tAF < tAFc. The measured critical angles for tAF > tAFc as well as for tAF < t AFc are well explained using S-W model.
| Original language | English |
|---|---|
| Pages (from-to) | 3011-3013 |
| Number of pages | 3 |
| Journal | IEEE Transactions on Magnetics |
| Volume | 42 |
| Issue number | 10 |
| DOIs | |
| State | Published - Oct 2006 |
Bibliographical note
Funding Information:This work was supported by the KoSEF through the Re-CAMM, Chungnam National University.
Keywords
- Critical AF thickness
- Critical angle
- Exchange bias and coercivity
- Stoner-Wohlfarth model
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