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Dive into the research topics of 'Concurrent defects of intrinsic tellurium and extrinsic silver in an n-type Bi 2 Te 2.88 Se 0.15 thermoelectric material'. Together they form a unique fingerprint.- Sort by
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Cham Kim, Yeokyung Yang, Ju Young Baek, David Humberto Lopez, Dong Hwan Kim, Hoyoung Kim
Research output: Contribution to journal › Article › peer-review