CAUSE: Critical application usage-aware memory system using non-volatile memory for mobile devices

Yeseong Kim, Mohsen Imani, Shruti Patil, Tajana S. Rosing

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

32 Scopus citations

Abstract

Mobile devices are severely limited in memory, which affects critical user-experience metrics such as application service time. Emerging non-volatile memory (NVM) technologies such as STT-RAM and PCM are ideal candidates to provide higher memory capacity with negligible energy overhead. However, existing memory management systems overlook mobile users application usage which provides crucial cues for improving user experience. In this paper, we propose CAUSE, a novel memory system based on DRAM-NVM hybrid memory architecture. CAUSE takes explicit account of the application usage patterns to distinguish data criticality and identify suitable swap candidates. We also devise NVM hardware design optimized for the access characteristics of the swapped pages. We evaluate CAUSE on a real Android smartphone and NVSim simulator using user application usage logs. Our experimental results show that the proposed technique achieves 32% faster launch time for mobile applications while reducing energy cost by 90% and 44% on average over non-optimized STT-RAM and PCM, respectively.

Original languageEnglish
Title of host publication2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages690-696
Number of pages7
ISBN (Electronic)9781467383882
DOIs
StatePublished - 5 Jan 2016
Event34th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015 - Austin, United States
Duration: 2 Nov 20156 Nov 2015

Publication series

Name2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015

Conference

Conference34th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015
Country/TerritoryUnited States
CityAustin
Period2/11/156/11/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

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