Abstract
Screen content images (SCIs) include many informative components, e.g., texts and graphics. Such content creates sharp edges or homogeneous areas, making a pixel distribution of SCI different from the natural image. Therefore, we need to properly handle the edges and textures to minimize information distortion of the contents when a display device’s resolution differs from SCIs. To achieve this goal, we propose an implicit neural representation using B-splines for screen content image super-resolution (SCI SR) with arbitrary scales. Our method extracts scaling, translating, and smoothing parameters of B-splines. The followed multilayer perceptron (MLP) uses the estimated B-splines to recover high-resolution SCI. Our network outperforms both a transformer-based reconstruction and an implicit Fourier representation method in almost upscaling factor, thanks to the positive constraint and compact support of the B-spline basis. Moreover, our SR results are recognized as correct text letters with the highest confidence by a pre-trained scene text recognition network. Source code is available at https://github.com/ByeongHyunPak/btc.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 |
| Publisher | IEEE Computer Society |
| Pages | 10062-10071 |
| Number of pages | 10 |
| ISBN (Electronic) | 9798350301298 |
| ISBN (Print) | 9798350301298 |
| DOIs | |
| State | Published - 2023 |
| Event | 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 - Vancouver, Canada Duration: 18 Jun 2023 → 22 Jun 2023 |
Publication series
| Name | Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition |
|---|---|
| Volume | 2023-June |
| ISSN (Print) | 1063-6919 |
Conference
| Conference | 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 |
|---|---|
| Country/Territory | Canada |
| City | Vancouver |
| Period | 18/06/23 → 22/06/23 |
Bibliographical note
Publisher Copyright:©2023 IEEE.
Keywords
- Deep learning architectures and techniques