Antiferromagnet thickness dependence of the training effect in exchange-coupled CoFe/MnIr bilayers

Dong Young Kim, Seok Soo Yoon, Cheolgi Kim, M. Tsunoda, M. Takahashi

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

The antiferromagnet thickness dependence of the net training effect is studied in exchange-coupled CoFe/MnIr bilayers. The maximum net training effect is observed near the critical thickness of the antiferromagnetic layer. The easy-axis redistribution of the unpinned antiferromagneic grains is explained by the two cycles of ferromagnetic-resonance measurement. The linear relationship between the net training effect and rotational hysteresis loss directly confirms that the training effect in ferromagnetic/antiferromagnetic bilayers originates from the reorientation of the unpinned antiferromagnetic grains from initial alignment to the final random state during consecutive cycles of hysteresis loops measurement.

Original languageEnglish
Article number5257288
Pages (from-to)3865-3868
Number of pages4
JournalIEEE Transactions on Magnetics
Volume45
Issue number10
DOIs
StatePublished - Oct 2009

Bibliographical note

Funding Information:
This work was supported by the Academic Research Foundation of Andong National University under Grant 2008-0085.

Keywords

  • Exchange coupling
  • Rotational loss
  • Training effect
  • Unpinned antiferromagnetic grains

Fingerprint

Dive into the research topics of 'Antiferromagnet thickness dependence of the training effect in exchange-coupled CoFe/MnIr bilayers'. Together they form a unique fingerprint.

Cite this