Angular dependence of exchange bias and coercivity in polycrystalline CoFe/MnIr bilayers

  • Dong Young Kim
  • , Cheol Gi Kim
  • , Chong Oh Kim
  • , M. Tsunoda
  • , M. Takahashi

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

We have investigated the angular dependence of exchange bias (Hex) and coercivity (Hc) in polycrystalline CoFe (100 nm)/MnIr(x) bilayers with x=0, 2, 4, 10 and 20 nm. The angular dependence of Hex and Hc show the abrupt kinks at critical angle (θc) in the samples of Hc>Hex. The profiles of angular dependent Hex is changed at critical antiferromagnetic layer thickness ( tAFc ) and shows inverse proportional behavior with field angle from 90°-θc to 90°+θc. These complex angular dependence of Hex and Hc with antiferromagnetic layer thickness can be well explained by using the Stoner-Wohlfarth (S-W) model.

Original languageEnglish
Pages (from-to)e56-e58
JournalJournal of Magnetism and Magnetic Materials
Volume304
Issue number1
DOIs
StatePublished - Sep 2006

Bibliographical note

Funding Information:
This work was supported by the KOSEF through ReCAMM in Chungnam National University.

Keywords

  • Coercivity
  • Exchange bias
  • S-W model
  • Unidirectional anisotropy

Fingerprint

Dive into the research topics of 'Angular dependence of exchange bias and coercivity in polycrystalline CoFe/MnIr bilayers'. Together they form a unique fingerprint.

Cite this