A study of the oxidation behavior and the postannealing effect in a graded SiGe/Si heterostructure
- Y. S. Lim
- , J. S. Jeong
- , J. Y. Lee
- , H. S. Kim
- , H. K. Shon
- , H. K. Kim
- , D. W. Moon
Research output: Contribution to journal › Article › peer-review
8
Scopus
citations