Abstract
This paper addresses the challenges of voltage-sensing read operations on a PRAM-based 1S1R crossbar array, which can be used for MAC operations in processing-inmemory architectures. The nonlinearity of the readout voltage due to the parallel resistance of the accessed cells leads to a narrow sensing margin. Moreover, the SAR ADC widely used in the readout circuits for area and power efficiency leads to high latency. To overcome these challenges, we introduce active feedback using a Gilbert multiplier to the bitline (BL) structure to regulate the resistance of the BL transmission gate and an input-aware SAR logic to optimize the conversion time. The proposed macro design in a 65nm process achieves a 3.79x voltage sensing margin with a Gilbert multiplier under a 3x3 kernel convolution operation. Furthermore, a 6-bit input-aware SAR ADC reduces average latency from 6 to 4.4 clock cycles.
Original language | English |
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Title of host publication | Proceedings - International SoC Design Conference 2023, ISOCC 2023 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 21-22 |
Number of pages | 2 |
ISBN (Electronic) | 9798350327038 |
DOIs | |
State | Published - 2023 |
Event | 20th International SoC Design Conference, ISOCC 2023 - Jeju, Korea, Republic of Duration: 25 Oct 2023 → 28 Oct 2023 |
Publication series
Name | Proceedings - International SoC Design Conference 2023, ISOCC 2023 |
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Conference
Conference | 20th International SoC Design Conference, ISOCC 2023 |
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Country/Territory | Korea, Republic of |
City | Jeju |
Period | 25/10/23 → 28/10/23 |
Bibliographical note
Publisher Copyright:© 2023 IEEE.
Keywords
- 1S1R crossbar array
- Gilbert multiplier
- PRAM
- SAR ADC
- processing-inmemory