A DC-to-12.5Gb/s 4.88mW/Gb/s all-rate CDR with a single LC VCO in 90nm CMOS

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Abstract

A DC-to-12.5Gb/s all-rate CDR IC with a single LC VCO is fabricated in 90nm CMOS. Static fractional dividers with an asynchronous phase calibration scheme are employed to generate all-rate clock signals without a phase mismatch or duty cycle distortion. The IC features an automatic loop gain control scheme which adjusts the bandwidth of a CDR automatically in the background for optimum BER performance by monitoring the phase difference between the incoming data and the recovered clock signal. The proposed CDR supports reference-less all-rate operation and compensates for 20dB of channel loss using a CTLE, a one-tap DFE and a three-tap pre-emphasis filter. The power efficiency of the test chip is 4.88mW/Gb/s.

Original languageEnglish
Title of host publication2015 IEEE Custom Integrated Circuits Conference, CICC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479986828
DOIs
StatePublished - 25 Nov 2015
EventIEEE Custom Integrated Circuits Conference, CICC 2015 - San Jose, United States
Duration: 28 Sep 201530 Sep 2015

Publication series

NameProceedings of the Custom Integrated Circuits Conference
Volume2015-November
ISSN (Print)0886-5930

Conference

ConferenceIEEE Custom Integrated Circuits Conference, CICC 2015
Country/TerritoryUnited States
CitySan Jose
Period28/09/1530/09/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

Keywords

  • All-rate CDR
  • asynchronous calibration loop
  • automatic loop gain calibration
  • static fractional divider

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