A 40-nm, 64-Kb, 56.67 TOPS/W Voltage-Sensing Computing-In-Memory/Digital RRAM Macro Supporting Iterative Write with Verification and Online Read-Disturb Detection

Jong Hyeok Yoon, Muya Chang, Win San Khwa, Yu Der Chih, Meng Fan Chang, Arijit Raychowdhury

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

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Computer Science